Multi-Mode Analysis of Dual Ridged Waveguide Systems for Material Characterization

被引：0
|
作者：
Crosby, Jason L. [1 ]
Hyde, Milo W. [1 ]
Havrilla, Michael J. [1 ]
机构：
[1] Air Force Inst Technol, Wright Patterson AFB, OH 45433 USA
来源：
2015 USNC-URSI RADIO SCIENCE MEETING (JOINT WITH AP-S SYMPOSIUM) PROCEEDINGS | 2015年
关键词：
D O I：
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中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
引用
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页码：33 / 33
页数：1
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