Observation of domain structures in Bi-based CaBi4Ti4O15 thin films by scanning force microscopy

被引：2
|
作者：
Fu, DS [1 ]
Suzuki, K [1 ]
Kato, K [1 ]
机构：
[1] Natl Inst Adv Ind Sci & Technol, Ceram Res Inst, Moriyama Ku, Nagoya, Aichi 4638560, Japan
来源：
FERROELECTRICS | 2003年 / 291卷
关键词：
scanning force microscopy; layered ferroelectrics; domains; piezoelectric; thin films;
D O I：
10.1080/00150190390222547
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Piezoresponse scanning force microscopy (Piezo-SFM) is applied to investigate the domain structures in polycrystalline CaBi4Ti4O15 (CBT) ferroelectric thin films prepared by a chemical solution deposition on Si substrate. By monitoring the vertical and lateral deflection signals from the SFM cantilever, we can visualize the out-of-plane and in-plane polarization vectors in the films individually. We show that the grains in the films consist of wedge-like multi-domains with polarization vector sloped away the thickness direction. A spatial distribution of piezoresponse has been observed in the films.
引用
收藏
页码：49 / 54
页数：6
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