Hardware Trojan Detection Using Controlled Circuit Aging

被引:18
|
作者
Surabhi, Virinchi Roy [1 ]
Krishnamurthy, Prashanth [1 ]
Amrouch, Hussam [2 ]
Basu, Kanad [3 ]
Henkel, Joerg [2 ]
Karri, Ramesh [1 ]
Khorrami, Farshad [1 ]
机构
[1] NYU Tandon Sch Engn, Dept Elect & Comp Engn, Brooklyn, NY 11201 USA
[2] Karlsruhe Inst Technol, Dept Comp Sci, D-76128 Karlsruhe, Germany
[3] Univ Texas Dallas, Dept Elect & Comp Engn, Dallas, TX 75080 USA
关键词
Hardware Trojan detection; machine learning; over-clocking; transistor aging;
D O I
10.1109/ACCESS.2020.2989735
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This paper reports a novel approach that uses transistor aging in an integrated circuit (IC) to detect hardware Trojans. When a transistor is aged, it results in delays along several paths of the IC. This increase in delay results in timing violations that reveal as timing errors at the output of the IC during its operation. We present experiments using aging-aware standard cell libraries to illustrate the usefulness of the technique in detecting hardware Trojans. Combining IC aging with over-clocking produces a pattern of bit errors at the IC output by the induced timing violations. We use machine learning to learn the bit error distribution at the output of a clean IC. We differentiate the divergence in the pattern of bit errors because of a Trojan in the IC from this baseline distribution. We simulate the golden IC and show robustness to IC-to-IC manufacturing variations. The approach is effective and can detect a Trojan even if we place it far off the critical paths. Results on benchmarks from the Trust-hub show a detection accuracy of & x2265; 99 & x0025;.
引用
收藏
页码:77415 / 77434
页数:20
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