Method of data acquisition channel calibration based on LSE

被引：0

作者：

Chen, ZX ^{[1
]}

Cheng, XC ^{[1
]}

Huang, ZP ^{[1
]}

Su, SJ ^{[1
]}

机构：

[1] Natl Univ Def Technol, Coll Mechatron Engn & Automat, Changsha 410073, Hunan, Peoples R China

来源：

ISTM/2005: 6th International Symposium on Test and Measurement, Vols 1-9, Conference Proceedings | 2005年

关键词：

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The ideal mathematics formula of A/D converter between its output value and input analog signal isn't yet tenable because of environment influence. After electric characteristic of the chips used by circuit are analyzed, data acquisition channel calibration model is established in aid of obtaining the corresponding relation between input analog signal and A/D output value. Then the model parameter estimation method based on LSE is presented. Lastly, it is proved that the model is correct and feasible by the test of DC and AC voltage signal.

引用

页码：243 / 246

页数：4

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