Atomic force microscopy of orb-spider-web-silks to measure surface nanostructuring and evaluate silk fibers per strand

被引：16

作者：

Kane, D. M. ^{[1
]}

Naidoo, N. ^{[1
]}

Staib, G. R. ^{[1
]}

机构：

[1] Macquarie Univ, Dept Phys, Sydney, NSW 2109, Australia

来源：

JOURNAL OF APPLIED PHYSICS | 2010年 / 108卷 / 07期

关键词：

BLACK-WIDOW; SCATTERING;

D O I：

10.1063/1.3490220

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Atomic force microscopy (AFM) study is used to measure the surface topology and roughness of radial and capture spider silks on the micro-and nanoscale. This is done for silks of the orb weaver spider Argiope keyserlingi. Capture silk has a surface roughness that is five times less than that for radial silk. The capture silk has an equivalent flatness of lambda/100 (5-6 nm deep surface features) as an optical surface. This is equivalent to a very highly polished optical surface. AFM does show the number of silk fibers that make up a silk thread but geometric distortion occurs during sample preparation. This prevented AFM from accurately measuring the silk topology on the microscale in this study. (C) 2010 American Institute of Physics. [doi:10.1063/1.3490220]

引用

页数：5