Atomic structure of InSb(001) and GaAs(001) surfaces imaged with noncontact atomic force microscopy

被引：38
|
作者：
Kolodziej, JJ
Such, B
Szymonski, M
Krok, F
机构：
[1] Jagiellonian Univ, Inst Phys, PL-30059 Krakow, Poland
[2] Jagiellonian Univ, Reg Lab Physicochem Anal & Struct Res, PL-30060 Krakow, Poland
来源：
PHYSICAL REVIEW LETTERS | 2003年 / 90卷 / 22期
关键词：
D O I：
10.1103/PhysRevLett.90.226101
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Noncontact atomic force microscopy (NC-AFM) has been used to study the c(8x2) InSb(001) and the c(8x2) GaAs(001) surfaces prepared by sputter cleaning and annealing. Atomically resolved tip-surface interaction maps display different characteristic patterns depending on the tip front atom type. It is shown that representative AFM maps can be interpreted consistently with the most recent structural model of A(III)B(V)(001) surface, as corresponding to the A(III) sublattice, to the B-V sublattice, or to the combination of both sublattices.
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页数：4
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