Trustworthy ICs for secure embedded computing

被引：1
|
作者：
Cheng, Tim
机构：
[1] IEEE Design and Test
来源：
IEEE DESIGN & TEST OF COMPUTERS | 2007年 / 24卷 / 06期
关键词：
D O I：
10.1109/MDT.2007.207
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：516 / 516
页数：1
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