Real-time IR/EO scene simulator (RISS) product improvements

被引：2
|
作者：
McKee, DC [1 ]
Simmons, OD [1 ]
Makar, RJ [1 ]
Nuwer, ME [1 ]
Palumbo, PW [1 ]
Schlossman, PG [1 ]
Perry, R [1 ]
Chan, L [1 ]
机构：
[1] Northrop Grumman Amherst Syst, Buffalo, NY 14221 USA
来源：
TECHNOLOGIES FOR SYNTHETIC ENVIRONMENTS: HARDWARE-IN-THE-LOOP TESTING VIII | 2003年 / 5092卷
关键词：
hardware-in-the-loop; infrared; electro-optic; simulation; stimulation;
D O I：
10.1117/12.501200
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
Northrop Grumman Amherst Systems has continued to improve the Real-time IR/EO Scene Simulator (RISS) for hardware-in-the-loop (HWIL) testing of infrared sensor systems. Several new and enhanced capabilities have been added to the system for both customer and internal development programs. A new external control capability provides control of either player trajectories or unit-under-test (UUT) orientation. The RISS Scene Rendering Subsystem (SRS) has been enhanced with support for texture transparency and increased texture memory capacity. The RISS Universal Programmable Interface (UPI) graphical user interface (GUI) has been improved to provide added flexibility and control of the real-time sensor modeling capabilities. This paper will further explore these and other product improvements.
引用
收藏
页码：259 / 267
页数：9
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