An Improved Thickness Correction Method of Analytical Formulations for Shielding Effectiveness Prediction

被引：8
|
作者：
Nie, Bao-Lin [1 ]
Liu, Qing-Song [2 ]
Du, Ping-An [1 ]
机构：
[1] Univ Elect Sci & Technol China, Sch Mechatron Engn, Chengdu 611731, Peoples R China
[2] Chongqing Univ, State Key Lab Power Transmiss Equipment & Syst Se, Chongqing 400044, Peoples R China
来源：
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY | 2016年 / 58卷 / 03期
基金：
中国博士后科学基金;
关键词：
Aperture coupling; electrical equipment enclosures; electromagnetic shielding; equivalent circuits; ENCLOSURES; APERTURES;
D O I：
10.1109/TEMC.2016.2533661
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper proposes an improved thickness correction method for circuital models that can predict the shielding effectiveness analytically. This method considers the thick aperture as a short section of waveguide separating the two interfaces of its ends and treats only the dominant mode in this section. It is found that the improved correction method can generate more accurate shielding effectiveness than the traditional method. In all the examples, the accuracy of the results is validated by the transmission line modeling method.
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页码：907 / 910
页数：4
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