Desktop X-ray microscopy and microtomography

被引：0
|
作者：
Sasov, A [1 ]
Van Dyck, D [1 ]
机构：
[1] Univ Antwerp, Visielab, Ruca, B-2020 Antwerp, Belgium
来源：
JOURNAL OF MICROSCOPY-OXFORD | 1998年 / 191卷
关键词：
microtomography; tomography; X-ray microscopy; X-ray radiography;
D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
Recent developments in X-ray microtomography have made it possible to miniaturize a CT scanner into a versatile and cost-effective desktop system that fits into any laboratory environment, The possibilities of the technique are demonstrated for a range of applications. It is also shown how an existing scanning electron microscope with an X-ray detector can, with a specially developed attachment, be transformed into an X-ray microscope and microtomograph.
引用
收藏
页码：151 / 158
页数：8
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