Next-generation design and test innovations

被引：0
|
作者：
Chakrabarty, Krishnendu
机构：
来源：
IEEE DESIGN & TEST OF COMPUTERS | 2010年 / 27卷 / 05期
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暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
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页码：4 / 4
页数：1
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