121: an advanced high-resolution resonant inelastic X-ray scattering beamline at Diamond Light Source

被引:41
|
作者
Zhou, Ke-Jin [1 ]
Walters, Andrew [1 ]
Garcia-Fernandez, Mirian [1 ]
Rice, Thomas [1 ]
Hand, Matthew [1 ]
Nag, Abhishek [1 ]
Li, Jiemin [1 ]
Agrestini, Stefano [1 ]
Garland, Peter [1 ]
Wang, Hongchang [1 ]
Alcock, Simon [1 ]
Nistea, Ioana [1 ]
Nutter, Brian [1 ]
Rubies, Nicholas [1 ]
Knap, Giles [1 ]
Gaughran, Martin [1 ]
Yuan, Fajin [1 ]
Chang, Peter [1 ]
Emmins, John [1 ]
Howell, George [1 ]
机构
[1] Diamond Light Source, Harwell Campus, Didcot OX11 0DE, Oxon, England
关键词
synchrotron radiation; soft X-ray beamline; resonant inelastic X-ray scattering; VLS-PGM; spectrometer; EXCITATIONS;
D O I
10.1107/S1600577522000601
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The 121 beamline at Diamond Light Source is dedicated to advanced resonant inelastic X-ray scattering (RIXS) for probing charge, orbital, spin and lattice excitations in materials across condensed matter physics, applied sciences and chemistry. Both the beamline and the RIXS spectrometer employ divergent variable-line-spacing gratings covering a broad energy range of 280-3000 eV. A combined energy resolution of similar to 35 meV (16 meV) is readily achieved at 930 eV (530 eV) owing to the optimized optics and the mechanics. Considerable efforts have been paid to the design of the entire beamline, particularly the implementation of the collection mirrors, to maximize the X-ray photon throughput. The continuous rotation of the spectrometer over 150 degrees under ultra high vacuum and a cryogenic manipulator with six degrees of freedom allow accurate mappings of low-energy excitations from solid state materials in momentum space. Most importantly, the facility features a unique combination of the high energy resolution and the high photon throughput vital for advanced RIXS applications. Together with its stability and user friendliness, 121 has become one of the most sought after RIXS beamlines in the world.
引用
收藏
页码:563 / 580
页数:18
相关论文
共 50 条
  • [1] High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies
    Strocov, V. N.
    Schmitt, T.
    Flechsig, U.
    Schmidt, T.
    Imhof, A.
    Chen, Q.
    Raabe, J.
    Betemps, R.
    Zimoch, D.
    Krempasky, J.
    Wang, X.
    Grioni, M.
    Piazzalunga, A.
    Patthey, L.
    [J]. JOURNAL OF SYNCHROTRON RADIATION, 2010, 17 : 631 - 643
  • [2] Spectrometer for high-resolution resonant inelastic x-ray scattering
    Schulke, W.
    Kaprolat, A.
    Fischer, Th.
    Hoppner, K.
    Wohlert, F.
    [J]. Review of Scientific Instruments, 1995, 66 (2 pt 2):
  • [3] High-resolution resonant inelastic X-ray scattering with soft X-rays at the ADRESS beamline of the Swiss light source: Instrumental developments and scientific highlights
    Schmitt, Thorsten
    Strocov, Vladimir N.
    Zhou, Ke-Jin
    Schlappa, Justine
    Monney, Claude
    Flechsig, Uwe
    Patthey, Luc
    [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2013, 188 : 38 - 46
  • [4] High-resolution resonant inelastic soft X-ray scattering applied to liquids
    Rubensson, Jan-Erik
    Hennies, Franz
    Pietzsch, Annette
    [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2013, 188 : 79 - 83
  • [5] High resolution inelastic x-ray scattering spectrometer at the advanced photon source
    Schwoerer-Bohning, M
    Macrander, AT
    Abbamonte, PM
    Arms, DA
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (09): : 3109 - 3112
  • [6] Resonant inelastic X-ray scattering endstation at the 1C beamline of Pohang Light Source II
    Kim, Jin-Kwang
    Dietl, Christopher
    Kim, Hyun-Woo J.
    Ha, Seung-Hyeok
    Kim, Jimin
    Said, Ayman H.
    Kim, Jungho
    Kim, B. J.
    [J]. JOURNAL OF SYNCHROTRON RADIATION, 2023, 30 : 643 - 649
  • [7] High-efficiency in situ resonant inelastic x-ray scattering (iRIXS) endstation at the Advanced Light Source
    Qiao, Ruimin
    Li, Qinghao
    Zhuo, Zengqing
    Sallis, Shawn
    Fuchs, Oliver
    Blum, Monika
    Weinhardt, Lothar
    Heske, Clemens
    Pepper, John
    Jones, Michael
    Brown, Adam
    Spucces, Adrian
    Chow, Ken
    Smith, Brian
    Glans, Per-Anders
    Chen, Yanxue
    Yan, Shishen
    Pan, Feng
    Piper, Louis F. J.
    Denlinger, Jonathan
    Guo, Jinghua
    Hussain, Zahid
    Chuang, Yi-De
    Yang, Wanli
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2017, 88 (03):
  • [8] SPECTROMETER FOR HIGH-RESOLUTION RESONANT INELASTIC X-RAY-SCATTERING
    SCHULKE, W
    KAPROLAT, A
    FISCHER, T
    HOPPNER, K
    WOHLERT, F
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (03): : 2446 - 2452
  • [9] High-energy-resolution inelastic X-ray scattering spectrometer at beamline 30-ID of the Advanced Photon Source
    Said, Ayman H.
    Sinn, Harald
    Toellner, Thomas S.
    Alp, Ercan E.
    Gog, Thomas
    Leu, Bogdan M.
    Bean, Sunil
    Alatas, Ahmet
    [J]. JOURNAL OF SYNCHROTRON RADIATION, 2020, 27 : 827 - 835
  • [10] Development of Superconducting Nanostrip X-Ray Detector for High-Resolution Resonant Inelastic Soft X-Ray Scattering (RIXS)
    Watanabe, Chiharu
    Ukibe, Masahiro
    Zen, Nobuyuki
    Fujii, Go
    Makise, Kazumasa
    Ohkubo, Masataka
    Lee, Te-Hui
    Huang, Di-Jing
    [J]. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2019, 29 (05)