Simultaneous Detection of Spin and Orbital Angular Momentum of Light through Scattering from a Single Silver Nanowire

被引:6
|
作者
Paul, Diptabrata [1 ]
Sharma, Deepak K. [2 ]
Kumar, G. V. Pavan [1 ]
机构
[1] Indian Inst Sci Educ & Res, Dept Phys, Pune 411008, Maharashtra, India
[2] Univ Bourgogne Franche Comte, Lab Interdisciplinaire Carnot Bourgogne, UMR 6303, CNRS, 9 Ave Alain Savary, F-21000 Dijon, France
关键词
spin-orbit interactions; angular momentum of light; singular optics; Fourier plane imaging; ELECTROMAGNETIC DIFFRACTION; OPTICAL SYSTEMS; PHASE;
D O I
10.1002/lpor.202200049
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In recent times the spin angular momentum (SAM) and orbital angular momentum (OAM) of light have gained prominence because of their significance in optical communication systems, micromanipulation, and sub-wavelength position sensing. To this end, simultaneous detection of SAM and OAM of light beam is one of the important topics of research from both application and fundamental spin-orbit interaction (SOI) point of view. While interferometry and metasurface based approaches have been able to detect the states, the presented approach involves elastic scattering from a monocrystalline silver nanowire for the simultaneous detection of SAM and OAM state of a circularly polarized Laguerre-Gaussian beam. By employing Fourier plane (FP) microscopy, the transmitted scattered light intensity distribution in the FP is analyzed to reconstruct the SAM and OAM state unambiguously. The SAM and OAM induced transverse energy flow as well as the polarization dependent scattering characteristics of the nanowire is investigated to understand the detection mechanism. This method is devoid of complex nanofabrication techniques and to the authors' knowledge, is a first example of single nano-object based simultaneous SAM and OAM detection. The study will further the understanding of SOI effects and can be useful for on-chip optical detection and manipulation.
引用
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页数:8
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