Effect of the Cr underlayer on evaporated CoCr films

被引：1

作者：

Watanabe, MM ^{[1
]}

Oppenheim, IC ^{[1
]}

Missell, FP ^{[1
]}

机构：

[1] UNIV SAO PAULO,INST FIS,BR-05389970 SAO PAULO,SP,BRAZIL

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1996年 / 159卷 / 1-2期

基金：

巴西圣保罗研究基金会;

关键词：

CoCr films; coercivity-composition dependence; texture; diffusion;

D O I：

10.1016/0304-8853(95)00937-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Electron-beam evaporation was used to produce films of CoCr/Cr/C/Si, for several film compositions and substrate temperatures (T-s), to investigate the relative importance of texture in determining the coercive field H-c of binary CoCr films for longitudinal recording. The highest H-c was observed in films for which both the Cr and CoCr layers were deposited at elevated T-s and where both Cr {110} and Cr {100} textures were observed in the Cr underlayer.

引用

页码：282 / 286

页数：5

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