Physics-based minority charge and transit time modeling for bipolar transistors

被引:48
|
作者
Schröter, M [1 ]
Lee, TY [1 ]
机构
[1] Conerant Syst Inc, Newport Beach, CA 92660 USA
关键词
D O I
10.1109/16.740893
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
lt has been well known for many Sears that the transit time model used in the SPICE Gummel-Poon model (SGPM) is not adequate for reliable design of circuits operating either at high current densities (including quasi-saturation). which is often the case in high-speed integrated circuits, or at low voltages, which is important for low-power applications. In addition, extraction of the SGPM's transit time model parameters is often very difficult and time consuming. Although various proposals for modeling the transit time were published in the past, most of them are not suited for compact transistor models required in circuit simulation from a numerical, parameter extraction and lateral scaling point of view. In this paper, a set of minority charge and transit time equations is derived which are physics-based and laterally scaleable as well as suitable for incorporation into compact models, Experimental results of the new model are presented in terms of transit time and transit frequency versus bias (I-C,I- V-CE), geometry, and temperature, showing excellent agreement for different types of silicon homojunction bipolar transistors.
引用
收藏
页码:288 / 300
页数:13
相关论文
共 50 条
  • [1] Physics-based model for tunnel heterostructure bipolar transistors
    López-González, JM
    García-Loureiro, AJ
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2004, 19 (11) : 1300 - 1305
  • [2] PHYSICAL MODELING OF THE TRANSIT-TIME IN BIPOLAR-TRANSISTORS
    WENG, J
    MICROELECTRONIC ENGINEERING, 1991, 15 (1-4) : 73 - 76
  • [3] Physics-based modeling of submicron GaN permeable base transistors
    Camarchia, V
    Bellotti, E
    Goano, M
    Ghione, G
    IEEE ELECTRON DEVICE LETTERS, 2002, 23 (06) : 303 - 305
  • [4] A Review of Physics-based Modeling of Millimeter-Wave Transistors
    Nouri, Soheil
    Avval, Amirreza G.
    El-Ghazaly, Samir M.
    2022 IEEE BICMOS AND COMPOUND SEMICONDUCTOR INTEGRATED CIRCUITS AND TECHNOLOGY SYMPOSIUM, BCICTS, 2022, : 203 - 207
  • [5] A Physics-Based Device Model of Transient Neutron Damage in Bipolar Junction Transistors
    Keiter, Eric R.
    Russo, Thomas V.
    Hembree, Charles E.
    Kambour, Kenneth E.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2010, 57 (06) : 3305 - 3313
  • [6] A physics-based transit time model for GaInP/GaAs HBT devices
    Tseng, Sheng-Che
    Meng, Chinchun
    Chen, Wei-Yu
    Su, Jen-Yi
    2005 ASIA-PACIFIC MICROWAVE CONFERENCE PROCEEDINGS, VOLS 1-5, 2005, : 1031 - 1034
  • [7] Proposed equivalent circuit physics-based model of InP based double heterojunction bipolar transistors
    Liu, Tao
    Wu, Gang
    Huang, Yongqing
    Yang, Taoxiang
    Zeng, Xiuhua
    Shi, Meiling
    Niu, Huijuan
    Fang, Wenjing
    SOLID-STATE ELECTRONICS, 2024, 219
  • [8] Physics-based modeling and real-time simulation
    Chen, JX
    Yang, YG
    Wang, XS
    COMPUTING IN SCIENCE & ENGINEERING, 2001, 3 (03) : 98 - 102
  • [9] A physics-based dynamic thermal impedance model for vertical bipolar transistors on SOI substrates
    Brodsky, JS
    Fox, RM
    Zweidinger, DT
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1999, 46 (12) : 2333 - 2339
  • [10] EMITTER SPACE-CHARGE LAYER TRANSIT-TIME IN BIPOLAR JUNCTION TRANSISTORS
    RUSTAGI, SC
    CHATTOPADHYAYA, SK
    SOLID-STATE ELECTRONICS, 1981, 24 (04) : 367 - 370