Discriminant Metric Learning Approach for Face Verification

被引:0
|
作者
Chen, Ju-Chin [1 ]
Wu, Pei-Hsun [2 ]
Lien, Jenn-Jier James [2 ]
机构
[1] Natl Kaohsiung Univ Appl Sci, Dept Comp Sci & Informat Engn, Kaohsiung 807, Taiwan
[2] Natl Cheng Kung Univ, Dept Comp Sci & Informat Engn, Tainan 70101, Taiwan
关键词
Metric learning; face verification; k-nearest neighbor; RECOGNITION; COLOR;
D O I
10.3837/tiis.2015.02.015
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In this study, we propose a distance metric learning approach called discriminant metric learning (DML) for face verification, which addresses a binary -class problem for classifying whether or not two input images are of the same subject. The critical issue for solving this problem is determining the method to be used for measuring the distance between two images. Among various methods, the large margin nearest neighbor (LMNN) method is a state-of-the-art algorithm. However, to compensate the LMNN's entangled data distribution due to high levels of appearance variations in unconstrained environments, DML's goal is to penalize violations of the negative pair distance relationship, i.e., the images with different labels, while being integrated with LMNN to model the distance relation between positive pairs, i.e., the images with the same label. The likelihoods of the input images, estimated using DML and LMNN metrics, are then weighted and combined for further analysis. Additionally, rather than using the k-nearest neighbor (k-NN)classification mechanism, we propose a verification mechanism that measures the correlation of the class label distribution of neighbors to reduce the false negative rate of positive pairs. From the experimental results, we see that DML can modify the relation of negative pairs in the original LMNN space and compensate for LMNN's performance on faces with large variances, such as pose and expression.
引用
收藏
页码:742 / 762
页数:21
相关论文
共 50 条
  • [1] Weighted Discriminant Analysis and Kernel Ridge Regression Metric Learning for Face Verification
    Chong, Siew-Chin
    Teoh, Andrew Beng Jin
    Ong, Thian-Song
    [J]. NEURAL INFORMATION PROCESSING, ICONIP 2016, PT II, 2016, 9948 : 401 - 410
  • [2] LOGISTIC SIMILARITY METRIC LEARNING FOR FACE VERIFICATION
    Zheng, Lilei
    Idrissi, Khalid
    Garcia, Christophe
    Duffner, Stefan
    Baskurt, Atilla
    [J]. 2015 IEEE INTERNATIONAL CONFERENCE ON ACOUSTICS, SPEECH, AND SIGNAL PROCESSING (ICASSP), 2015, : 1951 - 1955
  • [3] Triangular Similarity Metric Learning for Face Verification
    Zheng, Lilei
    Idrissi, Khalid
    Garcia, Christophe
    Duffner, Stefan
    Baskurt, Atilla
    [J]. 2015 11TH IEEE INTERNATIONAL CONFERENCE AND WORKSHOPS ON AUTOMATIC FACE AND GESTURE RECOGNITION (FG), VOL. 1, 2015,
  • [4] Cosine Similarity Metric Learning for Face Verification
    Hieu V. Nguyen
    Bai, Li
    [J]. COMPUTER VISION - ACCV 2010, PT II, 2011, 6493 : 709 - 720
  • [5] Discriminative Deep Metric Learning for Face Verification in the Wild
    Hu, Junlin
    Lu, Jiwen
    Tan, Yap-Peng
    [J]. 2014 IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR), 2014, : 1875 - 1882
  • [6] Discriminative Deep Metric Learning for Face and Kinship Verification
    Lu, Jiwen
    Hu, Junlin
    Tan, Yap-Peng
    [J]. IEEE TRANSACTIONS ON IMAGE PROCESSING, 2017, 26 (09) : 4269 - 4282
  • [7] Unconstrained Face Verification by Subspace Similarity Metric Learning
    Zhang, Hong
    Jiang, Chuan
    [J]. PROCEEDINGS OF THE 2017 12TH IEEE CONFERENCE ON INDUSTRIAL ELECTRONICS AND APPLICATIONS (ICIEA), 2017, : 170 - 173
  • [8] Learning a similarity metric discriminatively, with application to face verification
    Chopra, S
    Hadsell, R
    LeCun, Y
    [J]. 2005 IEEE COMPUTER SOCIETY CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION, VOL 1, PROCEEDINGS, 2005, : 539 - 546
  • [9] Weakly Supervised Compositional Metric Learning for Face Verification
    Chen, Jiawei
    Hu, Junlin
    [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 70
  • [10] Distance and Direction Based Deep Discriminant Metric Learning for Kinship Verification
    Zhu, Xiaoke
    Li, Changlong
    Chen, Xiaopan
    Zhang, Xinyu
    Jing, Xiao-Yuan
    [J]. ACM TRANSACTIONS ON MULTIMEDIA COMPUTING COMMUNICATIONS AND APPLICATIONS, 2023, 19 (01)