Preparation of c-BN films by RF sputtering and the relation of BN phase formation to the substrate bias and temperature

被引:18
|
作者
Zhao, YN
Wang, B [1 ]
Yu, S
Tao, YC
He, Z
Li, DM
Zou, GT
机构
[1] Jilin Univ, Natl Lab Superhard Mat, Changchun 130023, Jilin, Peoples R China
[2] Jilin Univ, Key Lab Supermol Struct & Spect, Changchun 130023, Jilin, Peoples R China
关键词
boron nitride; magnetron sputtering; Fourier transform infrared (FTIR);
D O I
10.1016/S0040-6090(97)01009-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper deals with the deposition of cubic boron nitride (c-BN) films by radio frequency (RF) magnetron sputtering. The nearly pure c-BN films have been prepared on Si(100) substrates using hexagonal boron nitride (h-BN) targets. Argon gas mixed with nitrogen gas was used as sputtering gas. The deposited Films were characterized by Fourier transform infrared (FTIR) spectroscopy and transmission electron diffraction (TED). A 'temperature-bias' phase diagram has been worked out. It indicates that the c-BN phase prefers the relative high temperature and negative bias. An opinion was presented that the c-BN nuclei grow discontinuously with every time the 'thermal spike' coming. (C) 1998 Elsevier Science S,A, All rights reserved.
引用
收藏
页码:220 / 222
页数:3
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