Measurement Technology for Multi-Parameter Spectral Responsivity of X-Ray Scintillation Crystals

Aimed at the measurement demand for development of better X-ray scintillation crystals, a photoelectrical detector for integrally test the multi-parameter spectral responsivity of scintillation crystals was developed. The conversion spectrum of the scintillation crystal excited by various X-ray energies under the critical focal length could be measured directly through the spectral output interface by one spectrometer, and the photovoltaic effect voltage of the PIN photodiode could be tested through the voltage output interface by one oscilloscope. Furthermore, the output power of fluorescence was calculated using an equivalent circuit. The measurement results show that the conversion efficiency of the scintillator declined along with the current increase of the X-ray tube while it has weak relation with the change in tube voltage. The experimental results show that the method presented in this paper is helpful for testing the scintillator properties.