Reliable Methodology for Experimental Extraction of Power Amplifier Dynamic Volterra Model

被引：0
|
作者：
Gapillout, D. [1 ,2 ]
Maziere, C. [1 ]
Ngoya, E. [2 ]
Mons, S. [2 ]
机构：
[1] AMCAD Engn, 20 Av Atlantis, F-87068 Limoges, France
[2] Univ Limoges, XLIM, UMR CNRS 6172, F-87060 Limoges, France
来源：
2015 INTEGRATED NONLINEAR MICROWAVE AND MILLIMETRE-WAVE CIRCUITS WORKSHOP (INMMIC) | 2015年
关键词：
Behavioral modeling; Nonlinear Memory; Power Amplifiers;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
High power amplifiers (PA) are inherently nonlinear and have an important impact on RF front-ends behavior. Then, for designing a transceiver system, accurate behavioral models are necessary. Such models must take into account nonlinear signal distortions and memory effects. This paper presents an experimental measurement methodology and the associated setup that allow a reliable identification of one of the most advanced PA models, namely, the Two-Memory Path Nonlinear Integral Model. The procedure is validated on a silicon bipolar Darlington power amplifier.
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页数：3
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