Simulated annealing method in electrical impedance tomography

被引：0
|
作者：
Giza, Z [1 ]
Filipowicz, SF [1 ]
Sikora, J [1 ]
机构：
[1] Warsaw Univ Technol, Dept Elect Engn, PL-00662 Warsaw, Poland
来源：
RECENT DEVELOPMENT IN THEORIES & NUMERICS | 2003年
关键词：
D O I：
10.1142/9789812704924_0031
中图分类号：
O29 [应用数学];
学科分类号：
070104 ;
摘要：
This paper presents a new method of the image reconstruction inside the body for Electrical Impedance Tomography (EIT). The advantage of using Simulated Annealing optimization method is the elimination of calculations of the objective function gradient and the opportunity to search the whole range of decision parameters values to find the lowest value of the objective function.
引用
收藏
页码：336 / 348
页数：13
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