Fourier Analysis-based Automatic Test Pattern Generation for Combinational Circuits

被引：0
|
作者：
Ayav, Tolga [1 ]
机构：
[1] Izmir Yuksek Teknol Enstitusu, Bilgisayar Muhendisligi Bolumu, Izmir, Turkey
来源：
2015 23RD SIGNAL PROCESSING AND COMMUNICATIONS APPLICATIONS CONFERENCE (SIU) | 2015年
关键词：
Combinational circuit; Fourier analysis; Walsh transformation; automatic test pattern generation; BENCHMARKS;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Fourier analysis of boolean functions has attracted great attention from computer scientists in the last decade but it still has few application areas. This work presents a Fourier analysis-based automatic test pattern generation method for combinational circuits.
引用
收藏
页码：128 / 131
页数：4
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