Comparative Modelling and Thermal Analysis of AlGaN/GaN Power Devices

被引:2
|
作者
Manandhar, Mahesh B. [1 ]
Matin, Mohammad A. [1 ]
机构
[1] Daniel Felix Ritchie Sch Engn, Dept Elect & Comp Engn, 2155 East Wesley Ave, Denver, CO 80208 USA
关键词
Wideband Gap; AlGaN; VDMOSFET; COMSOL; thermal simulation; heatsink; SEMICONDUCTOR; SIMULATION; INVERTER;
D O I
10.3390/jlpea11030033
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The use of Aluminum Gallium Nitride (AlGaN) as a power switching device material has been a promising topic of research in recent years. Along with Silicon Carbide (SiC) and Gallium Nitride (GaN), AlGaN is categorized as a Wideband Gap (WBG) material with intrinsic properties best suited for high power switching applications. This paper simulates and compares the thermal and electrical performance of AlGaN and Silicon (Si) MOSFETs, modeled in COMSOL Multiphysics. Comparisons between similar AlGaN/GaN and Si power modules are made in terms of heatsink requirements. The temperatures for the same operating voltage are found to be significantly lower for the AlGaN MOSFETs structures, compared to Si. The heatsink size for the AlGaN/GaN is found to be smaller compared to Si for the power modules.
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页数:16
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