Structural and Optoelectronic Characteristics of Well-Aligned ZnO Nanorod Arrays for Photodiodes

被引:3
|
作者
Ji, Liang-Wen [1 ]
Fang, Te-Hua [1 ,2 ,3 ]
Wu, Cheng-Zhi [1 ]
Chu, Tung-Te [4 ]
Jiang, Huilin [4 ]
Chang, Shoou-Jinn [5 ,6 ]
Peng, Shi-Ming [5 ,6 ]
Zhong, Jingchang [4 ]
Chang, Wen-Yang [7 ]
机构
[1] Natl Formosa Univ, Inst Electroopt & Mat Sci, Yunlin 632, Taiwan
[2] Natl Kaohsiung Univ Appl Sci, Dept Mech Engn, Kaohsiung 807, Taiwan
[3] Natl Kaohsiung Univ Appl Sci, Inst Mech & Precis Engn, Kaohsiung 807, Taiwan
[4] Changchun Univ Sci & Technol, Natl Key Lab High Power Semicond Laser, Changchun 130022, Peoples R China
[5] Natl Cheng Kung Univ, Inst Microelect, Tainan 701, Taiwan
[6] Natl Cheng Kung Univ, Dept Elect Engn, Tainan 701, Taiwan
[7] Natl Formosa Univ, Dept Mech & Comp Aided Engn, Yunlin 632, Taiwan
关键词
ZnO; Nanorod; Liquid-Phase-Deposition; Photodiodes; Photoluminescence; ZINC-OXIDE NANOWIRES; NANOPARTICLES; DEPOSITION; GROWTH; FILMS;
D O I
10.1166/jno.2010.1113
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Structural and optoelectronic characteristics of the well-aligned ZnO nanorod arrays were achieved by means of X-ray diffraction, scanning electron microscopy, transmission electron microscopy, photoluminescence (PL) and micro-Raman spectroscopy. The results indicated that the well-aligned ZnO nanorod with wurtzite structure was preferred oriented in the [002] c-axis direction. ZnO nanorod-based Schottky-barrier photodiodes has been also fabricated and characterized. With an incident wavelength of 370 nm and 5 V applied bias, it was found that maximum photoresponsivity of the photodiode was 0.051 A/W, which corresponded to a quantum efficiency of 21%.
引用
收藏
页码:295 / 299
页数:5
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