Application of clock gating techniques at a flip-flop level to switching noise reduction in VLSI circuits

被引:0
|
作者
Parra, P [1 ]
Castro, J [1 ]
Valencia, M [1 ]
Acosta, AJ [1 ]
机构
[1] CSIC, CNM, Inst Microelect, Seville 41012, Spain
来源
关键词
switching noise; low power; clock gating; submicron CMOS VLSI; digital and mixed-signal circuits;
D O I
10.1117/12.608276
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
One of the most important sources of switching noise in large VLSI circuits is the clock-driven circuitry, meaning that memory elements are the main source of noise in digital circuits. This paper faces the application of clock-gating, a well known low-power technique, to the reduction of switching-noise generation. Sources of switching noise in master-slave flip-flops will be analyzed. It will be shown how different solutions for the clock-gated logic show very different results regarding switching-noise generation. Illustrative examples characterized through HSPICE simulations, as well as the application of clock-gating to 16-bit synchronous counter as demonstrator, will provide useful design guidelines for reduction of switching noise generation.
引用
收藏
页码:1003 / 1014
页数:12
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