Low cost test apparatus for MEMS inertial sensors

被引：0
|
作者：
Anderson, Abby [1 ]
Dean, Robert [2 ]
Flowers, George [3 ]
Hodel, A. Scottedward [1 ]
机构：
[1] Auburn Univ, Dept Elect & Comp Engn, Auburn, AL 36849 USA
[2] Auburn Univ, Ctr Adv Veh Elect, Auburn, AL 36849 USA
[3] Auburn Univ, Dept Mech Engn, Auburn, AL 36849 USA
来源：
3RD INT CONF ON CYBERNETICS AND INFORMATION TECHNOLOGIES, SYSTEMS, AND APPLICAT/4TH INT CONF ON COMPUTING, COMMUNICATIONS AND CONTROL TECHNOLOGIES, VOL 2 | 2006年
关键词：
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
MEMS inertial sensors are low-cost devices that are commonly used for IMU development, both as stand-alone devices and as part of a sensor suite. We describe three low-cost methods used to evaluate MEMS device characteristics for the purposes of sensor modeling.
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页码：175 / +
页数：2
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