Extending energy-filtered transmission electron microscopy (EFTEM) into three dimensions using electron tomography

被引:50
|
作者
Weyland, M [1 ]
Midgley, PA [1 ]
机构
[1] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England
基金
英国工程与自然科学研究理事会;
关键词
electron tomography; EFTEM; electron microscopy; three-dimensional; reconstruction; stainless steel; magnetotactic bacteria;
D O I
10.1017/S1431927603030162
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The length scales on which materials microstructures are being formed, grown, and even designed are becoming increasingly small and increasingly three-dimensional. For such complex structures two-dimensional transmission electron microscopy (TEM) analysis is often inadequate and occasionally misleading. One approach to this problem is the modification of electron tomography techniques, developed for structural biology, for use in materials science. Energy-Filtered (EF) TEM elemental distribution images approximate to true projections of structure, and, as such, can be used to reconstruct the three-dimensional distribution of chemical species. A sample holder has been modified to allow the high tilt (+/-60degrees) required for tomography and a semiautomatic acquisition script designed to manage energy-loss acquisition. Tilt series data sets have been acquired from two widely different experimental systems, Cr carbides in 316 stainless steel and magnetite nanocrystals in magnetotactic bacteria, demonstrating single- and multiple-element tomography. It is shown that both elemental maps and jump-ratio images are suitable for reconstruction, despite the effects of diffraction contrast in the former and thickness changes in the latter. It is concluded that the image contrast, signal, and signal-to-noise ratio (SNR) are key to the achievable reconstruction quality and, as such, the technique may be of limited value for high energy loss/small inelastic cross section edges.
引用
收藏
页码:542 / 555
页数:14
相关论文
共 50 条
  • [1] Energy-filtered transmission electron microscopy (EFTEM) of semiconductor devices
    Subramanian, Sam
    Clark, Gary
    Ly, Khiem
    Chrastecky, Tony
    Electronic Device Failure Analysis, 2010, 13 (01): : 20 - 28
  • [2] Energy-filtered transmission electron microscopy (EFTEM) of intergrown pyroxenes
    Moore, KT
    Elbert, DC
    Veblen, DR
    AMERICAN MINERALOGIST, 2001, 86 (7-8) : 814 - 825
  • [3] EFTEM (energy-filtered transmission electron microscopy) characterization of separated materials in steel
    Hofer, F
    Warbichler, P
    EUROPEAN JOURNAL OF CELL BIOLOGY, 1997, 74 : 81 - 81
  • [4] Electron diffraction of polysiloxane-bound metal complexes using energy-filtered transmission electron microscopy (EFTEM)
    Zhou, F
    Plies, E
    Keller, F
    Schurig, V
    JOURNAL OF ELECTRON MICROSCOPY, 1999, 48 (05): : 601 - 603
  • [5] An introduction to energy-filtered transmission electron microscopy
    Thomas, PJ
    Midgley, PA
    TOPICS IN CATALYSIS, 2002, 21 (04) : 109 - 138
  • [6] An Introduction to Energy-Filtered Transmission Electron Microscopy
    P.J. Thomas
    P.A. Midgley
    Topics in Catalysis, 2002, 21 : 109 - 138
  • [7] Energy-filtered transmission electron microscopy: an overview
    Verbeeck, J
    Van Dyck, D
    Van Tendeloo, G
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2004, 59 (10-11) : 1529 - 1534
  • [8] Three-Dimensional Chemistry of Multiphase Nanomaterials by Energy-Filtered Transmission Electron Microscopy Tomography
    Roiban, Lucian
    Sorbier, Loic
    Pichon, Christophe
    Bayle-Guillemaud, Pascale
    Werckmann, Jacques
    Drillon, Marc
    Ersen, Ovidiu
    MICROSCOPY AND MICROANALYSIS, 2012, 18 (05) : 1118 - 1128
  • [9] ENERGY-FILTERED TRANSMISSION ELECTRON-MICROSCOPY OF FERRITIN
    SHUMAN, H
    SOMLYO, AP
    PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA-BIOLOGICAL SCIENCES, 1982, 79 (01): : 106 - 107
  • [10] Energy-filtered transmission electron microscopy of multilayers in semiconductors
    Liu, CP
    Boothroyd, CB
    Humphreys, CJ
    ELECTRON MICROSCOPY OF SEMICONDUCTING MATERIALS AND ULSI DEVICES, 1998, 523 : 159 - 164