Custom test fixtures using bolt-on transitions and calibration kits

被引：0
|
作者：
机构：
[1] ICM, Santa Clara, CA USA
来源：
MICROWAVE JOURNAL | 2003年 / 46卷 / 09期
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
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页码：218 / +
页数：2
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