Advanced image processing for defect visualization in infrared thermography

被引:16
|
作者
Plotnikov, YA [1 ]
Winfree, WP [1 ]
机构
[1] NASA, Langley Res Ctr, Hampton, VA 23681 USA
来源
THERMOSENSE XX | 1998年 / 3361卷
关键词
infrared thermography; image analysis; inverse problem; thermal tomography; nondestructive evaluations;
D O I
10.1117/12.304745
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Results of a defect visualization process based on pulse infrared thermography are presented. Algorithms have been developed to reduce the amount of operator participation required in the process of interpreting thermographic images. The algorithms determine the defect's depth and size from the temporal and spatial thermal distributions that exist on the surface of the investigated object following thermal excitation. A comparison of the results from thermal contrast, time derivative, and phase analysis methods for defect visualization are presented. These comparisons are based on three dimensional simulations of a test case representing a plate with multiple delaminations. Comparisons are also based on experimental data obtained from a specimen with flat bottom holes and a composite panel with delaminations.
引用
收藏
页码:331 / 338
页数:8
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