Ultrasound lock-in thermography for advanced depth resolved defect selective imaging

被引:25
|
作者
Gleiter, A. [1 ]
Riegert, G. [1 ]
Zweschper, Th [1 ]
Busse, G. [1 ]
机构
[1] Univ Stuttgart, Inst Polymer Testing & Polymer Sci, IKP, ZFP, D-7000 Stuttgart, Germany
关键词
D O I
10.1784/insi.2007.49.5.272
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Ultrasound lock-in thermography('attenuation mapping') is a defect selective 'dark field' NDT technique with a high probability of defect detection (PoD), since only defects produce a signal while other features are suppressed. The basic contrast mechanism is the enhanced local mechanical loss turning a variably loaded defect into a heat source. The method is being applied for quality maintenance, for example in the aerospace and automotive industry to monitor the integrity of thermal features. A variety of examples will be presented to illustrate how well the method is suited to locate defects and to distinguish their depths.
引用
收藏
页码:272 / 274
页数:3
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