A Simple Method to Improve Signal Integrity of Electrostatic Discharge Protection Devices

In this paper, we propose a simple method to compensate the non-ideality of electro-static discharge (ESI)) devices on signal integrity (SI). Such method can release the high requirement of small parasitic capacitance of ESD devices. Only two open stubs are required for each trace and the lengths are usually similar to the ESD protection device footprint size. Therefore, this method is cost-elUctive in real application. To validate the effect of this method, experiments are implemented on a commercial ESD product using for conventional USB 3.0 channel (5Gbps), and the improvement is significant. The results show the eye height is improved by 68 % and the jitter is unproved by 4.4 % for 15Gbps eye diagram test. Therefore, this method has the potential to extend the usable frequency band for ESI) protection devices.