Thermal stability of electrical and magnetic properties of a nanocrystalline Hf-Ni alloy

被引：2
|
作者：
Dong, ZF
Peng, LM
Luck, R
Lu, K
机构：
[1] Chinese Acad Sci, Inst Phys, Beijing Lab Electron Microscopy, Beijing 100080, Peoples R China
[2] Chinese Acad Sci, Ctr Condensed Matter Phys, Beijing 100080, Peoples R China
[3] Chinese Acad Sci, Inst Met Res, State Key Lab RSA, Shenyang 110015, Peoples R China
[4] Max Planck Inst Met Forsch, D-70174 Stuttgart, Germany
来源：
PHILOSOPHICAL MAGAZINE LETTERS | 1998年 / 77卷 / 06期
基金：
中国国家自然科学基金;
关键词：
D O I：
10.1080/095008398178327
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The thermal stability of a nanocrystalline (NC) Hf11Ni89 alloy was studied using X-ray diffraction, transmission electron microscopy, resistivity measurements and magnetothermal analysis. Microstructure and composition evolution in the grain boundaries and nanograins prior to evident grain growth was detected, and it was shown that this evolution may have a significant influence on the electrical resistivity and magnetic properties of the sample. Our findings demonstrated that the thermal stability of properties of NC materials is not necessarily equivalent to the grain-size stability of the same materials.
引用
收藏
页码：345 / 350
页数：6
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