A note on generalized aberration in factorial designs

被引：136
|
作者：
Ma, CX
Fang, KT
机构：
[1] Nankai Univ, Dept Stat, Tianjin 300071, Peoples R China
[2] Chinese Acad Sci, Beijing, Peoples R China
[3] Hong Kong Baptist Univ, Hong Kong, Hong Kong, Peoples R China
来源：
METRIKA | 2001年 / 53卷 / 01期
关键词：
code theory; discrepancy; minimum aberration; orthogonal fractional factorial designs; uniformity; uniform design; wordlength pattern; generalized wordlength pattern;
D O I：
10.1007/s001840100112
中图分类号：
O21 [概率论与数理统计]; C8 [统计学];
学科分类号：
020208 ; 070103 ; 0714 ;
摘要：
In this paper we extend the wordlength pattern and minimum aberration for non-regular factorials. The new concepts, the generalized wordlength pattern and minimum generalized aberration, are proposed. Some connections between the generalized wordlength pattern and uniformity are given. Some applications of the new concepts in the Blackett and Burman's designs are discussed.
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页码：85 / 93
页数：9
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