The Breakdown Characteristics of Multigap Pseudospark Under Nanosecond Pulsed Voltages

被引：10
|
作者：
Zhang, Jia [1 ]
Zhao, Junping [2 ]
Zhang, Qiaogen [1 ]
机构：
[1] Xi An Jiao Tong Univ, Sch Elect Engn, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Peoples R China
[2] Xi An Jiao Tong Univ, Sch Elect Engn, High Voltage Div, Xian 710049, Peoples R China
来源：
IEEE TRANSACTIONS ON PLASMA SCIENCE | 2014年 / 42卷 / 12期
关键词：
Breakdown characteristics; fast electron ionization effect; multigap pseudospark; ELECTRON-BEAM; DISCHARGE; GENERATION; DRIVEN;
D O I：
10.1109/TPS.2014.2361917
中图分类号：
O35 [流体力学]; O53 [等离子体物理学];
学科分类号：
070204 ; 080103 ; 080704 ;
摘要：
In this paper, breakdown characteristics of multigap pseudospark under nanosecond pulsed voltages were studied. Experimental results reveal that the characteristics under nanosecond pulsed voltages show the trend that the breakdown voltages decrease with the increase of the pressure and gap distance, increase with the increase of the number of gaps. Based on the experimental results, an empirical relationship was obtained. In the end, fast electron ionization effect has been observed, which offers successful explanations of the progress of multigap pseudospark discharge under nanosecond pulsed voltages.
引用
收藏
页码：3886 / 3890
页数：5
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