Method of error analysis for phase-measuring algorithms applied to photoelasticity

被引：3

作者：

Quiroga, JA ^{[1
]}

Gonzalez-Cano, A ^{[1
]}

机构：

[1] Univ Complutense, Dept Opt, Fac Ciencias Exactas, E-28040 Madrid, Spain

来源：

APPLIED OPTICS | 1998年 / 37卷 / 20期

关键词：

D O I：

10.1364/AO.37.004488

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present a method of error analysis that can be applied for phase-measuring algorithms applied to photoelasticity. We calculate the contributions to the measurement error of the different elements of a circular polariscope as perturbations of the Jones matrices associated with each element. The Jones matrix of the real polariscope can then be calculated as a sum of the nominal matrix and a series of contributions that depend on the errors associated with each element separately. We apply this method to the analysis of phase-measuring algorithms for the determination of isoclinics and isochromatics, including comparisons with real measurements. (C) 1998 Optical Society of America.

引用

页码：4488 / 4495

页数：8

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