Phase retrieval methods for optical imaging and metrology

被引：0

作者：

Pedrini, G. ^{[1
]}

Faridian, A. ^{[1
]}

Gao, P. ^{[1
]}

Naik, D. ^{[1
]}

Singh, A. ^{[1
]}

Osten, W. ^{[1
]}

Takeda, M. ^{[2
]}

机构：

[1] Univ Stuttgart, Inst Tech Opt, D-70174 Stuttgart, Germany

[2] Utsunomiya Univ, Ctr Opt Res & Educ, Utsunomiya, Tochigi 321, Japan

来源：

2014 13TH WORKSHOP ON INFORMATION OPTICS (WIO) | 2014年

关键词：

holography; phase retrieval; image reconstruction; DIGITAL HOLOGRAPHIC MICROSCOPY; STRUCTURED ILLUMINATION; RESOLUTION ENHANCEMENT;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Phase retrieval methods have useful applications for optical imaging and metrology. We will see how holographic techniques may be used for increasing the resolution of microscopic images, measurement of residual stresses, imaging of occluded objects, imaging using incoherent illumination; furthermore, phase retrieval methods, which do not use a reference wave, are described.

引用

页数：3

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