Native Oxidation Growth on Ge(111) and (100) Surfaces

被引:59
|
作者
Sahari, Siti Kudnie [1 ]
Murakami, Hideki [1 ]
Fujioka, Tomohiro [1 ]
Bando, Tatsuya [1 ]
Ohta, Akio [1 ]
Makihara, Katsunori [1 ]
Higashi, Seiichiro [1 ]
Miyazaki, Seiichi [1 ]
机构
[1] Hiroshima Univ, Dept Semicond Elect & Integrat Sci, Grad Sch Adv Sci Matter, Hiroshima 7398530, Japan
关键词
RAY PHOTOELECTRON-SPECTROSCOPY; BY-LAYER OXIDATION; CHEMICAL-STABILITY; SULFUR PASSIVATION; SI(001) SURFACES; GE(100) SURFACE; OXIDE; HYDROGEN; TERMINATION; INTERFACES;
D O I
10.1143/JJAP.50.04DA12
中图分类号
O59 [应用物理学];
学科分类号
摘要
We studied the native oxide growth on Ge(100) and (111) surfaces treated by HCl and HF cleaning in clean room air by high-resolution X-ray photoelectron spectroscopy (XPS) and spectroscopic ellipsometry (SE). The native oxidation of both HCl- and HF-last Ge(100) surfaces exhibited likely layer-by-layer fashion. The native oxide growth of the n-Ge(100) was significantly faster than the p-Ge(100) at the early stage of native oxidation. This can be explained by the formation of an O2- ion through free electron transfer from the Ge to the adsorbed O-2 molecules, which induces the surface electric field that can initiate the oxidation. In the case of different crystallographic orientations, the oxide rate of the Ge(100) surface was faster than that of the Ge(111) surface. This might be attributed to larger open space of the Ge(100) surface than that of the Ge(111) surface. (C) 2011 The Japan Society of Applied Physics
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页数:4
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