Reflection type heterodyne grating interferometry for in-plane displacement measurement

被引:41
|
作者
Hsu, Cheng-Chih [1 ]
Wu, Chyan-Chyi [1 ]
Lee, Ju-Yi [2 ]
Chen, Hui-Yi [2 ]
Weng, Han-Fu [1 ]
机构
[1] Ind Technol Res Inst, Ctr Measurement Stds, Hsinchu 300, Taiwan
[2] Natl Cent Univ, Inst Optomechatron Engn, Jhongli 320, Taoyuan Cty, Taiwan
关键词
D O I
10.1016/j.optcom.2007.12.098
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A novel method is presented for one-dimensional (I-D) and two-dimensional (2-D) in-plane displacements measurement that is based on the heterodyne grating interferometry. The novel setup of the optical configuration reduces the airstreams disturbance and maintains the environmental vibration at minimum level, allowing high stability and low measurement error to be achieved. Resulting from the theoretical calculation, our method can be sensitive to the sub-picometer level. With highly controlled isolation system, the low frequency noise can be reduced to minimum level, and only high frequency noises are considered, our method can achieve the resolution about 0.5 nm within 250 gm displacement. In addition, 2-D in-plane displacement measurement can be accomplished with a single interferometer simultaneously. (c) 2008 Published by Elsevier B.V.
引用
收藏
页码:2582 / 2589
页数:8
相关论文
共 50 条
  • [1] Measurement of in-plane displacement by wavelength-modulated heterodyne speckle interferometry
    Lee, Ju-Yi
    Lu, Ming-Pei
    Lin, Kun-Yi
    Huang, Szu-Han
    [J]. APPLIED OPTICS, 2012, 51 (08) : 1095 - 1100
  • [2] IN-PLANE DISPLACEMENT MEASUREMENT BY SPECKLE INTERFEROMETRY
    DEBACKER, LC
    [J]. NON-DESTRUCTIVE TESTING, 1975, 8 (04): : 177 - 180
  • [3] Optical heterodyne grating interferometry for displacement measurement with subnanometric resolution
    Lee, Ju-Yi
    Chen, Hui-Yi
    Hsu, Cheng-Chih
    Wu, Chyan-Chyi
    [J]. SENSORS AND ACTUATORS A-PHYSICAL, 2007, 137 (01) : 185 - 191
  • [4] Local measurement of high gradient in-plane displacement/strain fields by automated grating interferometry
    Kujawinska, M
    Salbut, L
    Sitnik, R
    [J]. LASER INTERFEROMETRY IX: TECHNIQUES AND ANALYSIS, 1998, 3478 : 359 - 365
  • [5] Heterodyne Wollaston laser encoder for measurement of in-plane displacement
    Hsieh, Hung-Lin
    Chen, Wei
    [J]. OPTICS EXPRESS, 2016, 24 (08): : 8693 - 8707
  • [6] Heterodyne grating interferometry based on sinusoidal phase modulation for displacement measurement
    Lee, Ju-Yi
    Hsieh, Hung-Lin
    Lin, Zhi Ying
    [J]. OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION X, 2017, 10329
  • [7] SENSOR FOR IN-PLANE DISPLACEMENT MEASUREMENT BASED ON COMBINED GRATING AND SPECKLE PATTERN PHASE SHIFTING INTERFEROMETRY
    Lukaszewski, Dariusz
    Salbut, Leszek
    [J]. JOURNAL OF THEORETICAL AND APPLIED MECHANICS, 2012, 50 (04) : 1063 - 1072
  • [8] Spatially Separated Heterodyne Grating Interferometer for In-Plane and Out-of-Plane Displacement Measurements
    Chang, Di
    Yin, Ziqi
    Sun, Yunke
    Hu, Pengcheng
    Tan, Jiubin
    Fan, Zhigang
    [J]. PHOTONICS, 2022, 9 (11)
  • [9] Wavelength-modulated heterodyne grating shearing interferometry for precise displacement measurement
    Hsieh, Hung-Lin
    Lee, Ju-Yi
    Chung, Yu-Che
    [J]. ADVANCED OPTICAL TECHNOLOGIES, 2014, 3 (04) : 395 - 400
  • [10] Photorefractive holographic interferometry for the measurement of object tilt and in-plane displacement
    Wang, YR
    Wang, QP
    Li, P
    Lan, J
    Guo, K
    [J]. OPTICAL INFORMATION PROCESSING TECHNOLOGY, 2002, 4929 : 230 - 236