Measuring adhesion on rough surfaces using atomic force microscopy with a liquid probe

被引:8
|
作者
Escobar, Juan V. [1 ]
Garza, Cristina [1 ]
Castillo, Rolando [1 ]
机构
[1] Univ Nacl Autonoma Mexico, Inst Fis, POB 20-364, Mexico City 01000, DF, Mexico
来源
关键词
atomic force microscopy; force of adhesion; functionalized-tip cantilevers; liquid probe; CONTACT-ANGLE HYSTERESIS; SUPERHYDROPHOBIC SURFACES; DROPLETS; WATER; AFM; RELAXATION; TIPS;
D O I
10.3762/bjnano.8.84
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We present a procedure to perform and interpret pull-off force measurements during the jump-off-contact process between a liquid drop and rough surfaces using a conventional atomic force microscope. In this method, a micrometric liquid mercury drop is attached to an AFM tipless cantilever to measure the force required to pull this drop off a rough surface. We test the method with two surfaces: a square array of nanometer-sized peaks commonly used for the determination of AFM tip sharpness and a multi-scaled rough diamond surface containing sub-micrometer protrusions. Measurements are carried out in a nitrogen atmosphere to avoid water capillary interactions. We obtain information about the average force of adhesion between a single peak or protrusion and the liquid drop. This procedure could provide useful microscopic information to improve our understanding of wetting phenomena on rough surfaces.
引用
收藏
页码:813 / 825
页数:13
相关论文
共 50 条
  • [1] Adhesion of tungsten particles on rough tungsten surfaces using Atomic Force Microscopy
    Peillon, Samuel
    Autricque, Adrien
    Redolfi, Michael
    Stancu, Cristian
    Gensdarmes, Francois
    Grisolia, Christian
    Pluchery, Olivier
    [J]. JOURNAL OF AEROSOL SCIENCE, 2019, 137
  • [2] Measuring bacterial adhesion using atomic force microscopy
    Li, X
    Logan, BE
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2003, 225 : U802 - U802
  • [3] Measuring graphene adhesion using atomic force microscopy with a microsphere tip
    Jiang, Tao
    Zhu, Yong
    [J]. NANOSCALE, 2015, 7 (24) : 10760 - 10766
  • [4] Adhesion forces in conducting probe atomic force microscopy
    Tivanski, AV
    Bemis, JE
    Akhremitchev, BB
    Liu, HY
    Walker, GC
    [J]. LANGMUIR, 2003, 19 (06) : 1929 - 1934
  • [5] Measuring the Influence of Solution Chemistry on the Adhesion of Au Nanoparticles to Mica Using Colloid Probe Atomic Force Microscopy
    Thio, Beng Joo Reginald
    Lee, Jung-Hyun
    Meredith, J. Carson
    Keller, Arturo A.
    [J]. LANGMUIR, 2010, 26 (17) : 13995 - 14003
  • [6] Measuring the Adhesion Force on Natural Fibre Surface Using Scanning Probe Microscopy
    Kafi, Abdullah A.
    Magniez, Kevin
    Fox, Bronwyn L.
    [J]. JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY, 2012, 26 (1-3) : 175 - 187
  • [7] Measuring the adhesion and mechanical properties of individual cells using atomic force microscopy
    不详
    [J]. EUROPEAN BIOPHYSICS JOURNAL WITH BIOPHYSICS LETTERS, 2005, 34 (06): : 555 - 555
  • [8] Measuring the thickness of the liquid-like layer on ice surfaces with atomic force microscopy
    Döppenschmidt, A
    Butt, HJ
    [J]. LANGMUIR, 2000, 16 (16) : 6709 - 6714
  • [9] ADHESION FORCE IMAGING IN AIR AND LIQUID BY ADHESION MODE ATOMIC-FORCE MICROSCOPY
    VANDERWERF, KO
    PUTMAN, CAJ
    DEGROOTH, BG
    GREVE, J
    [J]. APPLIED PHYSICS LETTERS, 1994, 65 (09) : 1195 - 1197
  • [10] Adhesion and friction studies of microsphere-patterned surfaces in contact with atomic force microscopy colloidal probe
    Zhang, Xiaoliang
    Lu, Yongjuan
    Liu, Eryong
    Yi, Gewen
    Jia, Junhong
    [J]. COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS, 2012, 401 : 90 - 96