A compact and versatile tender X-ray single-shot spectrometer for online XFEL diagnostics

被引：8
|
作者：
Rehanek, Jens [1 ]
Milne, Christopher J. [1 ]
Szlachetko, Jakub [1 ,2 ]
Czapla-Masztafiak, Joanna [1 ,3 ]
Schneider, Jorg [1 ]
Huthwelker, Thomas [1 ]
Borca, Camelia N. [1 ]
Wetter, Reto [1 ]
Patthey, Luc [1 ]
Juranic, Pavle [1 ]
机构：
[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland
[2] Jan Kochanowski Univ, Inst Phys, Swietokrzyska 21, PL-25406 Kielce, Poland
[3] Polish Acad Sci, Inst Nucl Phys, PL-31342 Krakow, Poland
来源：
JOURNAL OF SYNCHROTRON RADIATION | 2018年 / 25卷
关键词：
free-electron laser; tender X-ray spectroscopy; single-shot measurement; SCATTERING; DETECTOR;
D O I：
10.1107/S1600577517012796
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
One of the remaining challenges for accurate photon diagnostics at X-ray free-electron lasers (FELs) is the shot-to-shot, non-destructive, high-resolution characterization of the FEL pulse spectrum at photon energies between 2 keV and 4 keV, the so-called tender X-ray range. Here, a spectrometer setup is reported, based on the von Hamos geometry and using elastic scattering as a fingerprint of the FEL-generated spectrum. It is capable of pulse-to-pulse measurement of the spectrum with an energy resolution (Delta E/E) of 10(-4), within a bandwidth of 2%. The Tender X-ray Single-Shot Spectrometer (TXS) will grant to experimental scientists the freedom to measure the spectrum in a single-shot measurement, keeping the transmitted beam undisturbed. It will enable single-shot reconstructions for easier and faster data analysis.
引用
收藏
页码：16 / 19
页数：4
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