Low-Coherence Speckle Interferometry (LCSI) for characterisation of adhesion in adhesive bonded joints

被引：10
|
作者：
Gastinger, K [1 ]
Winther, S [1 ]
Hinsch, KD [1 ]
机构：
[1] SINTEF, Mat Technol, Dept Appl Phys, N-7465 Trondheim, Norway
来源：
SPECKLE METROLOGY 2003, PROCEEDINGS | 2003年 / 4933卷
关键词：
low-coherence interferometry; adhesion; microscopic ESPI; microscopic OCT;
D O I：
10.1117/12.516577
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Low Coherence Speckle Interferometry (LCSI) combines the depth-resolved measurement of Low Coherence Interferometry (LCI) with the high-accuracy deformation measurement of Electronic Speckle Pattern Interferometry (ESPI). Depth-resolved deformation measurement enables the characterisation of the behaviour of interfaces in multi-layer materials or structures while changing the ambient conditions. In this paper LCSI is introduced as a new tool for characterisation of adhesion. The experimental set-up and the principle of work are described. A FEM-model of an adhesive bonded aluminium joint is developed to analyse the behaviour of the Al-adhesive interface during mechanical testing. Some recent results are shown. This application demand measurements on a microscopic scale (camera field of view down to 500 x 500mum).
引用
收藏
页码：59 / 65
页数：7
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