New Capability Indices for Non Normal Processes

被引：6
|
作者：
Grau, Daniel [1 ]
机构：
[1] Univ Pau & Pays Adour, Lab Appl Math, CNRS, IUT Bayonne,UMR 5142, F-64100 Bayonne, France
来源：
COMMUNICATIONS IN STATISTICS-THEORY AND METHODS | 2010年 / 39卷 / 16期
关键词：
Non normal populations; Process capabilities indices; Uncentered target;
D O I：
10.1080/03610920903156839
中图分类号：
O21 [概率论与数理统计]; C8 [统计学];
学科分类号：
020208 ; 070103 ; 0714 ;
摘要：
When the distribution of one of the characteristics of a process is non normal, methods based on empirical percentiles suggest the use of several process capability indices (PCIs) which are similar to the usual Cp, Cpk, Cpm, and Cpmk indices. However most of these PCIs apply only to the case of symmetrical tolerances. To take into account the asymmetry of the tolerances as well as the asymmetry of the process distribution, new PCIs which improve the previous ones are proposed. In the end and in order to validate the method proposed here, we apply it to a real production case.
引用
收藏
页码：2913 / 2929
页数：17
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