Amplitude and phase measument using reflection polarization mode of a prism-based surface plasmon resonance

被引：0
|
作者：
Sanchez Hernandez, Hector Hugo [1 ]
Manuel Perez-Abarca, Juan [1 ]
Santiago Alvarado, Agustin [2 ]
Sinue Cruz-Felix, A. [2 ]
机构：
[1] Univ Papalopan, Loma Bonita, Oaxaca, Mexico
[2] Univ Tecnol Mixteca, Huajuapan De Leon, Oaxaca, Mexico
来源：
REVISTA MEXICANA DE FISICA | 2022年 / 68卷 / 03期
关键词：
Surface plasmon; polarization; ellipsometry; film thickness; RESOLUTION ENHANCEMENT; SENSORS;
D O I：
10.31349/RevMexFis.68.031304
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
In this paper, the amplitude and phase characteristics of internal reflection of gold nanofilms are investigated using polarization modulation of electromagnetic radiation in the Kretschmann geometry, an excited wavelength of the Surface Plasmon Resonance (SPR) at 633 nm is considered. The numerical results that are presented in this work are based on the substrate, the variation of the thickness of the dielectric and the type of plasmonic material using gold (Ag), through the ellipsometry parameters Psi and Delta.
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页数：6
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