Substrate structure dependence of the growth modes of p-quaterphenyl thin films on gold

被引:11
|
作者
Müllegger, S
Mitsche, S
Pölt, P
Hänel, K
Birkner, A
Wöll, C
Winkler, A
机构
[1] Graz Univ Technol, Inst Solid State Phys, A-8010 Graz, Austria
[2] Inst Electron Microscopy, FELMI, A-8010 Graz, Austria
[3] Ruhr Univ Bochum, D-44801 Bochum, Germany
基金
奥地利科学基金会;
关键词
electron diffraction; organic semiconductors; scanning electron microscopy; surface structure;
D O I
10.1016/j.tsf.2005.02.038
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The variably oriented crystallite surfaces of a recrystallized polycrystalline gold sample served as substrates for the investigation of the structure dependence of p-quaterphenyl (4P) thin film growth. The films were prepared in ultrahigh vacuum by organic molecular beam evaporation. Optical microscopy, scanning electron microscopy, combined with laterally resolved electron backscatter diffraction and scanning tunnelling microscopy have been applied to determine the correlation between the substrate surface structure and 4P film morphology. Crystallite surfaces consisting of (110) terraces favour highly anisotropic needle-like 4P growth with the needle orientation normal to the An (110) directions. Atomic steps on vicinal planes with narrow terraces (< 2 nm) can also induce anisotropy in the 4P thin film growth, in particular elongated 4P islands normal to the step direction. In contrast to that, a nearly isotropic distribution of the needle orientations is observed on Au grains terminated by highly symmetric (111) or (100) crystal planes. Additionally, patches of continuous 4P layers can be found on these surfaces. There is strong evidence that the 4P molecules within the needle-like crystallites are oriented parallel to the Au surface, whereas for the continuous layers the 4P molecules are oriented nearly upright on the surface. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:408 / 414
页数:7
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