A High-Frequency Compact Model for Graphene Resonant Channel Transistors Including Mechanical Nonlinear Effects

被引:1
|
作者
Mei, Tengda [1 ]
Xu, Yuehang [1 ]
Lan, Yu [1 ]
Li, Oupeng [1 ]
Sarder, Md Rajon [1 ]
Xu, Ruimin [1 ]
Li, Yanrong [2 ]
机构
[1] Univ Elect Sci & Technol China, Sch Elect Engn, Chengdu 611731, Sichuan, Peoples R China
[2] Univ Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devic, Chengdu 610054, Sichuan, Peoples R China
基金
中国国家自然科学基金; 中国博士后科学基金;
关键词
Graphene resonant channel transistors (G-RCTs); graphene resonators; large signal model; nanoelectromechanical system (NEMS); nonlinearity; NITRIDE GATE DIELECTRICS; FIELD-EFFECT TRANSISTORS; ELECTRICAL READOUT; MONOLAYER GRAPHENE; FET MODEL; SILICON; STRENGTH; SHEETS;
D O I
10.1109/TMTT.2017.2698458
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a physical-based high-frequency nonlinear model of graphene resonant channel transistors (G-RCTs), including a nonlinear electromechanical model of doubled clamped graphene mechanical resonators. To accurately describe the temperature-dependent modal dispersion, both bias-and temperature-dependent effects are considered. The temperature-dependent built-in strain, the bias-based electrostatic force, and the spring restoring force, including the nonlinear term upon deformation, are used to describe the mechanical motion of the suspended beam. The nonlinear model is validated by the measured results of G-RCTs, which indicate that our model can predict the experimental results well. Moreover, the nonlinear effects, including harmonic distortion, third-order intermodulation distortion, and the hysteresis and nonlinear behavior of G-RCTs, are also studied. The results show that the nonlinear physical model can predict the response of G-RCTs very well. These results also show that the mechanical nonlinearity has strong effects on nonlinear distortion for G-RCTs. The nonlinear equivalent circuit model could be useful for nanoelectromechanical system in the applications of high-frequency integrated circuits.
引用
收藏
页码:4063 / 4072
页数:10
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