INTERFACE STRUCTURE OF Si(111) √3 x √3-Ag STUDIED BY GRAZING INCIDENCE X-RAY DIFFRACTION.

被引：0
|
作者：
Akimoto, Koichi [1 ]
Lijadi, Melania [1 ]
Susani, Takayuki [1 ]
Ichimiya, Ayahiko [1 ]
机构：
[1] Nagoya Univ, Dept Quantum Engn, Chikusa Ku, Nagoya, Aichi 46401, Japan
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 1996年 / 52卷
关键词：
D O I：
10.1107/S0108767396081172
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
MS12.01.03
引用
收藏
页码：C459 / C459
页数：1
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