Thermal and electrical switching studies on Ge20Se80-xBix (1≤x≤13) ternary chalcogenide glassy system

被引:10
|
作者
Gunti, Srinivasa Rao [1 ]
Asokan, S. [1 ]
机构
[1] Indian Inst Sci, Dept Instrumentat, Bangalore 560012, Karnataka, India
关键词
Chalcogenide glass; ADSC; Glass transition; Electrical switching; DIFFERENTIAL SCANNING CALORIMETRY; CARRIER-TYPE REVERSAL; AS-TE GLASSES; FORMING LIQUIDS; CONSTRAINT THEORY; NETWORK GLASSES; HEAT-CAPACITY; RANGE ORDER; SE GLASSES; GE-TE;
D O I
10.1016/j.jnoncrysol.2010.06.028
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Alternating Differential Scanning Calorimetric (ADSC) and electrical switching studies have been undertaken on Ge20Se80-xBix glasses (1 <= x <= 13), to understand the effect of topological thresholds on thermal properties and electrical switching behavior. It is found that the compositional dependence of glass transition temperature (Tg), crystallization temperature (T-c1) and thermal stability (AT) of Ge20Se80-xBix glasses show anomalies at a composition x= 5, the rigidity percolation/stiffness threshold of the system. Further, unusual variations are also observed in different thermal properties, such as T-g, T-c1, Delta T, Delta C-p and Delta H-NR, at the composition x= 10, which indicates the occurrence of chemical threshold in these glasses at this composition. Electrical switching studies indicate that Ge20Se8o_RBig glasses with 5 11 exhibit threshold switching behavior and those with x = 12 and 13 show memory switching. A sharp decrease has been noticed in the switching voltages with bismuth concentration, which is due to the more metallic nature of bismuth and the presence of Bi+ ions. Further, a saturation is seen in the decrease in V-T around x = 6, which is related to bismuth phase percolation at higher concentrations of Bi. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码:1637 / 1643
页数:7
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