A wavelet-based method to discriminate between inrush current and internal fault

被引:0
|
作者
Hong, SY [1 ]
Qin, W [1 ]
机构
[1] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore
关键词
inrush current; short-circuit current; hysterisis loop; wavelet transform; back-propagation;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
With the development of power system, the content of the second harmonic current can be comparable to that produced in the inrush current. Conventional used second harmonic current restrained method becomes unreliable for transformer protection. To obtain some new approaches on discrimination between inrush current and internal fault, transformer models with enough precision of computing inrush current and short-circuit current are firstly described. After that, Daubechies family wavelets are selected as mother wavelet to analyze the inrush current and short-circuit current. The results show that the characteristics of inrush current are significantly different from those of short-circuit current. Based on the analyzing result, the Back-propagation neural network is trained to discriminate the inrush current and short-circuit current. The training results presented in this paper show that wavelet based discrimination method is efficient with good performance and reliability.
引用
收藏
页码:927 / 931
页数:5
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