Strain distribution and Raman spectroscopy in individual Ge/CdSe biaxial nanowires

被引:0
|
作者
Wang, Dong [1 ,2 ]
Wang, Chunrui [1 ,2 ]
Xu, Jing [1 ,2 ]
Wu, Binhe [1 ,2 ]
Ouyang, Lizhi [3 ]
Parthasarathy, Ranganathan [3 ]
Chen, Xiaoshuang [1 ,2 ,4 ]
机构
[1] Donghua Univ, Dept Appl Phys, Shanghai 201620, Peoples R China
[2] Donghua Univ, State Key Lab Modificat Chem Fibers & Polymer Mat, Shanghai 201620, Peoples R China
[3] Tennessee State Univ, Coll Engn, Dept Math Sci, Nashville, TN 37209 USA
[4] Chinese Acad Sci, Shanghai Inst Tech Phys, Natl Lab Infrared Phys, Shanghai 200083, Peoples R China
基金
中国国家自然科学基金;
关键词
CORE-SHELL NANOWIRES; POLARIZED PHOTOLUMINESCENCE; SEMICONDUCTORS; ENHANCEMENT; SCATTERING; SHIFTS; CDSE;
D O I
10.7567/JJAP.54.025001
中图分类号
O59 [应用物理学];
学科分类号
摘要
The interface property modulated by strain is one of the key factors that determine the performance of heterostructure nanowire devices. In this study, the strain distribution in a Ge/CdSe biaxial nanowire was calculated by a finite element method using boundary conditions. The components of the strain tensor of the biaxial nanowire show different characteristics from those of core-shell nanowires. The relationship between the strain and Raman mode of a Ge sub-nanowire is then revealed. The calculated and measured Raman modes of a Ge sub-nanowire in a Ge/CdSe biaxial nanowire have the same variation in redshift and wide peak as those of unstrained Ge nanowires. (C) 2015 The Japan Society of Applied Physics
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收藏
页数:7
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