CP, T and CPT in B-factories

被引：0

作者：

Bernabéu, J ^{[1
]}

机构：

[1] Univ Valencia, Dept Fis Teor, Valencia 46100, Spain

来源：

ACTA PHYSICA POLONICA B | 2001年 / 32卷 / 06期

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

I discuss a novel method to study the indirect violation of the discrete symmetries CP, T and CPT in the B-d-system. It is based on the opportunity offered by B-factories to tag the CP eigenstate of B-d by means of the CP Conserving Direction. Transitions between both flavour and CP tagged states are used to construct genuine and non-genuine CP-odd, T-odd and CPT-odd asymmetries.

引用

页码：1809 / 1820

页数：12

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