Multiferroic (Nd,Fe)-doped PbTiO3 thin films obtained by pulsed laser deposition

被引：3

作者：

Dumitru-Grivei, M. ^{[1
]}

Ion, V. ^{[1
]}

Birjega, R. ^{[1
]}

Moldovan, A. ^{[1
]}

Craciun, F. ^{[2
]}

Cernea, M. ^{[3
]}

Galassi, C. ^{[4
]}

Dinescu, M. ^{[1
]}

机构：

[1] Natl Inst Laser, Plasma & Radiat Phys, 409 Atomistilor, Magurele 077125, Romania

[2] ISM CNR, Area Ric Roma Tor Vergata, Via Fosso del Cavaliere, I-00133 Rome, Italy

[3] Natl Inst Mat Phys, Atomistilor 405 A, Bucharest 077125, Romania

[4] CNR ISTEC, Ist Sci & Tecnol Mat Ceram, Via Granarolo 64, I-48018 Faenza, Italy

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2019年 / 125卷 / 02期

关键词：

FERROELECTRICITY; PHYSICS;

D O I：

10.1007/s00339-019-2403-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We report the successful growth of multiferroic (Nd,Fe)-doped PbTiO3 thin films with the composition (Pb0.88Nd0.08)(Ti0.93Fe0.05Mn0.02)O-3 (PNFT) using pulsed laser deposition. The deposited films have been investigated by XRD, SEM, energy-dispersive X-ray spectroscopy (EDS), secondary-ion mass spectroscopy (SIMS), atomic force microscopy, magnetic force microscopy, piezoforce microscopy, spectroscopic ellipsometry (SE) and dielectric spectroscopy measurements. PNFT films deposited on different substrates (MgO, SrTiO3 and Nb:SrTiO3) are (001) oriented, preserving the orientation of the single-crystal substrates. EDS mapping and SIMS across the film thickness probed the uniform distribution of all the elements. The refractive index and extinction coefficient have been obtained with the SE software package and refined with an optical-graded model. Magnetic domains and ferroelectric domains have been evidenced at microscopic scale. Good dielectric properties and low loss, comparable to those of bulk materials, have been obtained.

引用

页数：11

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C. Galassi
M. Dinescu
[J]. Applied Physics A, 2019, 125
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